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Evde / Ürün / Otomatik Montaj Ekipmanı / AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control
Kalite AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control fabrika
Kalite AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control fabrika
Kalite AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control fabrika
Kalite AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control fabrika
Kalite AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control fabrika

AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control

Temel Özellikler
Menşe Yeri: Çin
Marka Adı: XingTe
Sertifikasyon: CE,IOS9001,KC,ISO45001,ISO24001
Ticaret Mülkleri
Minimum Sipariş Miktarı: 1
Fiyat: Pazarlık edilebilir
Ödeme Koşulları: L/C,D/A,D/P,T/T
Etiketler

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Ürün Özetleri
Product Introduction This high-precision visual inspection equipment is specially developed for AWG arrayed waveguide grating devices. Based on high-magnification microscopic imaging and AI image algorithms, it performs non-contact inspection on AWG chip end faces and waveguide channels. It ...

Ürün Ayrıntıları

Vurgulamak:

Non-contact AWG End-face Inspection Machine

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AI Intelligent Defect Judgment AWG End-face Inspection Machine

,

MES System Compatible AWG End-face Inspection Machine
Ürün Tanımı
Product Introduction This high-precision visual inspection equipment is specially developed for AWG arrayed waveguide grating devices. Based on high-magnification microscopic imaging and AI image algorithms, it performs non-contact inspection on AWG chip end faces and waveguide channels. It identifies appearance defects such as scratches, chipping, stains and waveguide damage on end faces, and simultaneously measures key geometric parameters including channel position and

Mr. Jason wong

sales manager

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