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Σπίτι / Προϊόντα / Αυτοματοποιημένος εξοπλισμός συναρμολόγησης / AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control
Ποιότητα AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control Εργοστάσιο
Ποιότητα AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control Εργοστάσιο
Ποιότητα AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control Εργοστάσιο
Ποιότητα AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control Εργοστάσιο
Ποιότητα AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control Εργοστάσιο

AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control

Βασικές Ιδιότητες
Τόπος καταγωγής: Κίνα
Επωνυμία Μάρκας: XingTe
Πιστοποίηση: CE,IOS9001,KC,ISO45001,ISO24001
Εμπορικά Ακίνητα
Ελάχιστη ποσότητα παραγγελίας: 1
Τιμή: Διαπραγματεύσιμος
Όροι πληρωμής: L/C,D/A,D/P,T/T
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Σύνοψη του προϊόντος
Product Introduction This high-precision visual inspection equipment is specially developed for AWG arrayed waveguide grating devices. Based on high-magnification microscopic imaging and AI image algorithms, it performs non-contact inspection on AWG chip end faces and waveguide channels. It ...

Λεπτομέρειες προιόντος

Επισημαίνω:

Non-contact AWG End-face Inspection Machine

,

AI Intelligent Defect Judgment AWG End-face Inspection Machine

,

MES System Compatible AWG End-face Inspection Machine
Περιγραφή προϊόντων
Product Introduction This high-precision visual inspection equipment is specially developed for AWG arrayed waveguide grating devices. Based on high-magnification microscopic imaging and AI image algorithms, it performs non-contact inspection on AWG chip end faces and waveguide channels. It identifies appearance defects such as scratches, chipping, stains and waveguide damage on end faces, and simultaneously measures key geometric parameters including channel position and

Mr. Jason wong

sales manager

Συγγενικά προϊόντα

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