AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control

This high-precision visual inspection equipment is specially developed for AWG arrayed waveguide grating devices. Based on high-magnification microscopic imaging and AI image algorithms, it performs non-contact inspection on AWG chip end faces and waveguide channels. It identifies appearance defects such as scratches, chipping, stains and waveguide damage on end faces, and simultaneously measures key geometric parameters including channel position and spacing. Suitable for in-line quality control in mass production of high-speed optical module AWG devices. Inspection data can be stored for traceability and supports connection to the production line MES system.

• Quick changeover of tooling fixtures to accommodate inspection requirements for multiple specifications of AWG chips
• Non-contact inspection to prevent secondary damage to devices and support continuous batch testing
• High-resolution microscopic imaging to accurately identify micron-level end-face damage and waveguide defects
• AI intelligent defect judgment with built-in inspection criteria to reduce manual interpretation errors
• Automatic archiving of inspection results, output of inspection reports, compatible with production line MES system