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आपका स्वागत है Shenzhen XingTe Technology Co., Ltd.
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घर / उत्पाद / स्वचालित असेंबली उपकरण / AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control
गुणवत्ता AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control कारखाना
गुणवत्ता AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control कारखाना
गुणवत्ता AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control कारखाना
गुणवत्ता AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control कारखाना
गुणवत्ता AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control कारखाना

AWG End-face Inspection Machine with Non-contact Inspection and AI Intelligent Defect Judgment for MES System Compatible Quality Control

मूलभूत गुण
उत्पत्ति का स्थान: चीन
ब्रांड नाम: XingTe
प्रमाणन: CE,IOS9001,KC,ISO45001,ISO24001
व्यापारिक संपत्तियाँ
न्यूनतम आदेश मात्रा: 1
कीमत: बातचीत योग्य
भुगतान की शर्तें: एल/सी,डी/ए,डी/पी,टी/टी
टैग

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Dual Lens Dual FA Automatic Coil Winding Machine

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उत्पाद सारांश
Product Introduction This high-precision visual inspection equipment is specially developed for AWG arrayed waveguide grating devices. Based on high-magnification microscopic imaging and AI image algorithms, it performs non-contact inspection on AWG chip end faces and waveguide channels. It ...

उत्पाद का विवरण

प्रमुखता देना:

Non-contact AWG End-face Inspection Machine

,

AI Intelligent Defect Judgment AWG End-face Inspection Machine

,

MES System Compatible AWG End-face Inspection Machine
उत्पाद का वर्णन
Product Introduction This high-precision visual inspection equipment is specially developed for AWG arrayed waveguide grating devices. Based on high-magnification microscopic imaging and AI image algorithms, it performs non-contact inspection on AWG chip end faces and waveguide channels. It identifies appearance defects such as scratches, chipping, stains and waveguide damage on end faces, and simultaneously measures key geometric parameters including channel position and

Mr. Jason wong

sales manager

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